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Detailed Program
Paper Number : EL-P05
Time Frame : 12:00~13:30
Presentation Date : Friday, 28, November
Session Name : Electronic Ceramics
Session Chair 1# : -
Session Chair 2# : -
Dielectric properties of PIN-PMN-PT Films Prepared by Aerosol-Deposition Method
Ms.Soo-bin Kang
Inha University
PIN-PMN-PT(Pb(In1/2Nb1/2)O3-Pb(Mg1/3Nb2/3)O3-PbTiO3) is one of the relaxor-PT based single crystals. As the relaxor-PT based single crystals revealed high piezoelectric and electromechanical properties, the research of these materials was widely carried out. However, their low Curie temperature (Tc~130-170oC) restrict the application to device due to depoling at low temperature [1]. To overcome this problem, the binary relaxor solid solution system was studied such like PIN-PT, PYN-PT, and PSN-PT. But the crystal growth and the composition controlling of these binary system were very difficult. So lately, the new relaxor based ternary system PIN-PMN-PT was studied. The ternary PIN-PMN-PT could be applied for capacitors in electronic, transducers, MEMS and etc due to the high rhombohedral - tetragonal phase transition temperature. In this study, We fabricated the PIN-PMN-PT films by aerosol - deposition (AD) method. By using the AD method, the films revealed nano-sized grain and dense structure at the room temperature. The AD method can fabricate film through the collision of fine ceramic powder particles onto substrate. The (sub-)micrometer sized particles are crushed nano size, and have strong adhesion between films and substrate. The AD films revealed the slim polarization - electric field hysteresis loop due to the nano-grain like a nano-domain of relaxor ferroelectric [2]. Through the post annealing process, grain size and crystallinity can be controlled, resulting in the improvement of the electrical properties of the AD films. We compared dielectric and ferroelectric properties of the single crystal with the aerosol deposited films. The crystallographic phases of the PIN-PMN-PT films were analyzed through a high resolution X-ray diffraction. The microstructures of the surfaces and fracture sections were observed by field emission scanning electron microscopy. The ferroelectric properties, the dielectric constant by change of the frequency were measured using an impedance analyzer. The polarization - electric field (P-E) hysteresis loops were examined using a standard ferroelectric test system.
Acknowledgements : This research was supported by Agency for Defense Development(ADD-12-02-04-01.