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Detailed Program
Paper Number : EL-P07
Time Frame : 12:00~13:30
Presentation Date : Friday, 28, November
Session Name : Electronic Ceramics
Session Chair 1# : -
Session Chair 2# : -
Energy Storage Properties of Lead Lanthanum Zirconate Titanate Films by Aerosol Deposition Method
Prof. Mngeun Choi
Inha University
The rapid development of the electric vehicle industry is requiring the high energy density discharge device [1]. In general, the ceramic based capacitor was used for high energy discharge while short time, but, the lower breakdown voltage of than polymer based capacitor decreased the energy density of device. As the breakdown voltage is proportional to density of ceramics, the high density film is required for the improvement of the energy density. Another method for increasing stored energy is the using of high dielectric constant material such like ferroelectric. However, ferroelectric reveals the large dielectric loss due to the high value of remnant polarization and this dielectric loss induce the temperature rise of devices [2]. Therefore, the anti-ferroelectric which has low remnant polarization is suitable as the material of energy device. Lead Lanthanum Zirconate-Titanate (PLZT) is noted anti-ferroelectric material and has been widely researched for various applications such as actuators, sensors and transducers in the micro electro mechanical systems (MEMS) [2,3]. A-site (Pb-site) of PZT is substituted with the La ion. The differences of ion size and valence electron number between Pb ion and La ion have caused defects in PZT structure. This phenomenon induces the phase change and the dielectric characters become from ferroelectric to anti-ferroelectric [3]. Also, the substitution of Sn into B-site modifies the dielectric properties of the material in the perovskite structure. In this present study, the Aerosol Deposition (AD) method was used to deposit Pb0.97La0.02(Zr,Sn,Ti)O3 films on Pt/Ti/SiO2/Si substrate modifying the Sn doping concentrations. As AD method can fabricate the dense structure films, the breakdown voltage of films can be easily increased. Also, the film has nano-sized grain and that would conduct like the nano domain of relaxor ferroelectric. The phases of films were identified by X-ray diffraction system (XRD) and the microstructures of films were observed by field emission scanning electron microscopy (FESEM). And, the polarization–electric field hysteresis loops were measured by using a standard ferroelectric test system..
Acknowledgements : This research was supported by Agency for Defense Development(ADD-12-02-04-01).