KJ Ceramics 31

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Detailed Program

Paper Number : LD-P03

Time Frame : 12:00~13:30

Presentation Date : Thursday, 27, November

Session Name : LED and Display Materials

Session Chair 1# : -

Session Chair 2# : -

TEM and XRD analysis of Thin Film Phosphors on Sapphire

Ki Woong Chae

Hoseo University

Keywords: Thin film, phosphors, TEM, XRD, sapphire, Eu-oxide

Transparent thin film phosphors can have potential applications in display devices and LED packagings. However, the transparency and the luminescence intensity are directly opposed properties that it can be hardly attained simultaneously. We recently reported that both properties can be achieved simultaneously when Eu-oxide is deposited on the sapphire substrate. Ihe deposited phases were so complicated that we could not draw any conclusion which phase contribute to the luminescence.
In this study we performed TEM and XRD analyses to identify the crystal phase on the substrate. The figure shows that TEM image of the thin film sample cross-sectioned across the sapphire substrate. We could confirmed the stacking faults by the Eu-diffusion through the sapphire substrate. The PL characteristics and transparency will be discussed in terms of the phase analysis results.
References:
[1] Ki-Woong Chae, Ta-Ryeong Park,Chae Il Cheon, Nam In Cho, and Jeong Seog Kim, Electron. Mater. Lett., 9(S) (2013) 59-63
[2] J. Y. Cho, Y.-D. Huh, Y. R. Do, Appl. Phys. Lett. 89 (2006) 131915.
[3] S. Yi, J. S. Bae, B. K. Moon, J. H. Jeong, and J. H. Kim, Appl. Phys. Lett. 86, 1 (2005) 07192

Acknowledgements :

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