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Detailed Program
Paper Number : TF-P01 |
Time Frame : 12:00~13:30 |
Presentation Date : Friday, 28, November |
Session Name : Thin Films & Layers |
Session Chair 1# : - |
Session Chair 2# : - |
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Structural and Electrical Properties of Chemical Solution Deposited 0.7BiFeO3-0.3CaTiO3 Solid Solution Thin Film |
Dr. Jin Won Kim |
Changwon National University |
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Structural and Electrical Properties of Chemical Solution Deposited 0.7BiFeO3-0.3CaTiO3 Solid Solution Thin Film J. W. Kim, C. M. Raghavan, J. Y. Choi, S. S. Kim* Department of Physics, Changwon National University, Changwon, Gyeongnam 641-773, Korea ∗sskim@changwon.ac.kr Keywords: BiFeO3, CaTiO3, Solid solution system, Chemical solution deposition, Ferroelectric properties, Thin film A 0.7BiFeO3-0.3CaTiO3 (7B3C) solid solution thin film was prepared on a Pt(111)/Ti/SiO2/Si(100) substrate by using a chemical solution deposition method. The microstructure and the surface morphology of the 7B3C solid solution thin film were investigated by an X-ray diffraction pattern, a Raman scattering spectrum and a SEM analysis. For electrical measurements, the upper platinum dot electrodes with areas of 1.54¢®¢¯10-4 cm2 were deposited by an ion sputter through a shadow mask. The improved electrical properties were observed in the 7B3C solid solution thin film compared to the pure BiFeO3 thin film. Acknowledgement: This work was supported by the Priority Research Centers Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2010-0029634). |
Acknowledgements : Acknowledgement: This work was supported by the Priority Research Centers Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education, Science and Technology (2010-0029634). |
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