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Detailed Program
Paper Number : CE-I06
Time Frame : 14:20~14:45
Presentation Date : Friday, 28, November
Session Name : Ceramics Culture and Education
Session Chair 1# : Ung-Soo Kim
Session Chair 2# : Naotaka Sakamoto
Quantitative Phase Analysis of Porcelain Raw Materials Using X-ray Diffraction Method
Seung-Joo KIM
Ajou University
Keywords: X-ray diffraction, Quantitative analysis, Porcelain raw materials

Powder X-ray diffraction (pXRD) is most commonly applied for characterization of polycrystalline samples. pXRD enables a non-destructive determination of the material composition and the determination of the crystalline structure of the components. It can also be used to measure various microstructural properties of these crystalline phases such as strain, grain size, and defect structure. Since H. Rietveld developed a whole pattern fitting structure refinement based on the powder XRD data in 1969, the refinement procedure called “Rielveld refinement” has been widely accepted as an exceptionally valuable method for structural analysis of nearly all classes of crystalline materials. In this presentation, the principle of the Rielveld refinement is introduced and applied for quantitative analysis of porcelain raw materials. Typical porcelain bodies are made from materials collected from selected deposits using different mixing proportions of clay, feldspar and quartz, which are heat-treated to form a mixture of glass and crystalline phases. The phase proportion is very important factor to affect the physical properties of porcelains. The present study investigates the accuracy and reliability of the quantitative Rietveld analysis at various weight fractions of the reference mixtures and several commercial products. For the analysis, a freely distributed program FULLPROF was used in its whole pattern fitting mode with CuKa X-ray data. Micro-strain and preferred orientation effects are also considered.

References:

[1] R.A. Young, The Rietveld Method (Oxford Publication, 1993)
[2] R.L. Snyder, J. Fiala and H.J. Bunge, Defects and Microstructure Analysis by Diffraction (Oxford Publications, 1999)
[3] W.I.F. David, K. Shankland, L.B. McCusker and Ch Baerlocher, Structure Determination from Powder Diffraction Data (Oxford Publications, 2002)
Acknowledgements : This work was supported by the National Research Foundation of Korea (grant No. 2010-0013089).